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Home > Technology List > Test probe cable assemblies designed for the inspection of high-freque

Test probe cable assemblies designed for the inspection of high-frequency circuits

Published time: 2019-12-20 21:51:27

Test probe cable assemblies designed for the inspection of high-frequency circuits

GradConn (Boca Raton, FL) has launched a new range of low-cost co-axial test probe cable assemblies for the inspection of high frequency circuits. Suitable for testing Hirose MS-156 and Murata MM8030 sub miniature coaxial switch connectors, the new probes offer reliable testing of RF circuits from development thru to final production. Features include:

• A mating test cycle durability of 500 operations and 2,000 with Murata.
• SMA jack connectors for plugging to test equipment. other coaxial interface connectors are available upon request.
• Applications such as cell phone, smartphone, WLAN/WiMax/UWB, Bluetooth, Zigbee, cordless phones, GPS/DVH-H, microwave measurement equipment, and microwave radio equipment applications.

For more information on the test probe cable assemblies, visit visit www.gradconn.com.

The Products of Murata include Monolithic Ceramic Capacitors, SAW Filters, Ceramic Resonators, Piezoelectric Sensors, Ceramic Filters, iezoelectric Buzzers, Short-range Wireless Communication Modules, Multilayer Ceramic Devices, Connectors, Isolators, Power Supplies, Circuit Modules, EMI Suppression Filters, Inductor (coils) and Sensors.

 

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