Multi-channel PXI-based test solution speeds LTE/LTE-Advanced waveform creation and analysis

Agilent Technologies Inc. (Santa Clara, CA) announced the LTE/LTE-Advanced multi-channel PXI-based test solution, which is positioned to accelerate the setup of multi-channel test system configurations and enables engineers to gain deeper insight into complex carrier aggregation and spatial multiplexing MIMO designs. This test solution provides tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyze multiple channels in the frequency and modulation domains simultaneously. The graphical user interface shortens the time it takes to set up a test configuration. In addition, measurement setups are optimized for LTE/LTE-Advanced MIMO and carrier aggregation configurations. The test solution’s chassis backplane trigger tool configures and routes the backplane triggers for proper time synchronization in MIMO configuration for up to two PXIe chassis. Time-synchronized MIMO testing (2x2 or 4x4) is easily accomplished using Agilent’s RF M9381A PXIe vector signal generators and M9391A PXIe vector signal analyzers, which provide less than 0.38% EVM and less than 20 nsec time synchronization between channels. In addition, the up to 160 MHz signal generation and analysis bandwidth is capable of supporting the widest LTE-Advanced carrier aggregation applications. This solution is appropriate for:

• Base stations.
• Microcells.
• Picocells.
• Repeaters.
• Mobile devices.

For more information, visit www.agilent.com

Agilent Technologies was Established in 1999，Agilent spun off from Hewlett-Packard Company as part of a corporate realignment that created two separate companies.

Tag: Communications Telecom/Datacom Wireless Newsletters

Previous: LED Driver ICs are optimized for high-line applications.

Next: Toshiba Expands Line-up of ARM Cortex -M-based Microcontrollers