Dust monitor detects particles as small as 0.3 μm
Update Time: 2019-12-20 02:26:45
Yokogawa Corporation of America (Newnan, GA) announces the release of the model DT450G dust monitor. The DT450G detects the qualitative level of dust or particulate matter by working off of the principle of inductive electrification. This probe provides a highly sensitive measurement and is capable of detecting particles as small as 0.3 μm. Utilization of inductive electrification allows for detection of not only particles which make contact with the probe, but particles which pass by the probe as well. The signal generated by these particles is processed by advanced noise filtering algorithms resulting in a highly accurate dust measurement. Features include:
? A measurement range that can be set through a one-touch operation in response to process conditions.
? Automatic drift compensation.
? Air purging which prevents condensate from accumulating at connection points.
? Utility in applications with process temperatures up to 250°C (482°F) and pressures up to 200 kPa (29 psi).For more information on the model DT450G, visit http://yokogawa.com/us.
Yokogawa Electric Corporation is dedicated to developing the most advanced control and instrumentation products, (and systems), in the world.
Previous: LED Driver ICs are optimized for high-line applications.
Next: Toshiba Develops Two New Process Technologies for Microcontrollers and Wireless Communication ICs



ALL CATEGORIES





