Accuprobe, Inc. [ Accuprobe ]
Accuprobe, founded in 1976, develops, manufactures, and markets high performance probing and interface products for use in the testing of integrated and hybrid circuits. This company's proprietary products are used by manufacturers of semiconductors and hybrid circuits to electronically screen their products for defects before they are incorporated into electronics systems. Such screening is accomplished in conjunction with automated test equipment (ATE) which transmits electrical signals through interface circuitry to probe cards which make the electrical/mechanical contact with each circuit under test.
The company's products are designed to provide more efficient screening of the circuits thereby increasing yields to manufacturers.The company's products address both the semiconductor wafer sort or IC test segment as well as the thick and thin film hybrid circuit, optical and laser trim segments of the semiconductor device market. The company offers a wide selection of probe technologies including Probe Ring (Epoxy Ring), Metal and Ceramic Blades, Z adjustable and Blade Spring probes.The company offers the service of probe card assembly and repair utilizing any of the above probe technologies. In addition, the company also designs and produces probe card assembly and maintenance equipment which will allow customers to assemble their own card assemblies.The company also offers the consumable materials for use with the assembly and repair equipment.To learn more about Accuprobe products, please review the information contained within this virtual catalog. If still additional information is required, please contact Accuprobe directly via Email , fax or by telephone at the location nearest you.
Accuprobe provides a full range of probes used to test active and passive semiconductor and hybrid devices. Adjustable probes provide the ultimate in flexibility and maintainability. Metal blades probes are the workhorse of the industry and are available in a wide range of types and sizes. Ceramic blade probes have particular application in sensitive and high-frequency measurement applications. Pogo probes are useful where uneven substrates need to be accessed and tested. A full page view of the probes profiles is available here.
An extensive range of probe cards are available to suit many probing applications and test equipment. Semiconductor 4 1/2" probe cards can be mounted with any of the assortment of probe styles to suit the particular device under test and application. Epoxy ring style cards are also available in this size. The hybrid industry typically uses 6 1/2" probe cards commensurate with larger substrate and device sizes. Chip resistor probe cards suitable for laser trimming of arrays of chip resistor provide extremely high efficiency. Round probe cards can also use the full compliment of probe styles and are typically mounted to a load board. Low current and other device and substrate measurements use specialized parametric test probe cards.
Customers building and maintaining their own probe cards can benefit from the proven probe card assembly and planarization stations available from Accuprobe. Planarization is especially important to extend the life of a probe card and to ensure effective yield. Complimentary probe manipulation tools allow probes to be selectively adjusted to meet alignment and planarization specifications.
Accuprobe laser trim card holders have long been the industry standard for flexible and efficient mounting of probe cards in laser trim systems. Probe card cleaning materials ensure effective use of probes and extend probe life.